Quality Plant Management
March 3, 2012
by Andrew Milivojevich
Statistical process control (SPC) is a decision tool developed in the 1920's by Walter Shewhart. Walter was a physicist and the father of modern day SPC. His work was motivated by a simple question, â€œhow do we know when a process is behaving abnormally?â€
February 3, 2012
by Tim Wilson
Tactile coordinate measuring machines (CMMs) and vision based non-contact systems each have their advantages. But combining the two in a single system can provide more measurement data more quickly to improve process control feedback, as well as saving time and cost, compared to measuring parts on several different systems.
December 4, 2011
by Tom Groff , Optical Gaging Products (OGP).
Shop Technology Magazine discusses the merits of off-line measurement with Optical Gaging Products' Tom Goff, and how manufacturers can benefit from the different systems available on the market today.
November 27, 2011
Mahr Federal has upgraded its software platform for its surface metrology systems. MarWin 4.5 offers increased functionality and ease of use, a range of new features, and a series of options for specific applications. The new platform is available on new systems and as an upgrade to all MarSurf XR, XC, XCR, and XT instruments.
November 8, 2011
Visionx Inc. has launched new software tools for its non-contact comparative measuring technology that allows users to compare a part to its CAD data in real time, completely automatically - an industry first according to Visionx's distributor Methods Machine Tools Inc.
October 13, 2011
The Plant Manager Cutting (PMC) software module is the most recent addition to the successful suite of Bysoft CAD/CAM software.
October 7, 2011
Offer the term “metrology equipment” to a group of industrial or manufacturing engineers in a word-association test and it's highly likely CMM (coordinate measuring machine) would be the response.
October 7, 2011
Nikon Metrology Inc.'s latest stereoscopic microscope, the SMZ-745, is an airtight, anti-electrostatic and anti-mould designed microscope that prevents samples from being damaged by electrostatic discharge, as well as contaminants such as dust and water.